• DocumentCode
    782631
  • Title

    New Full Wave Theory for Plane Wave Scattering From Rough Dielectric Surfaces—The Correction Current Method: TE Polarization

  • Author

    Whitman, Gerald M. ; Yoon, Byung-Tae ; Schwering, Felix K.

  • Author_Institution
    Electr. & Comput. Eng. Dept., New Jersey Inst. of Technol., Newark, NJ
  • Volume
    56
  • Issue
    7
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    2002
  • Lastpage
    2017
  • Abstract
    A new full-wave theory for scattering from rough dielectric surfaces-called the correction current (CC) method-is presented. An iterative solution is developed leading to a first-order scatter pattern in the form of a single integral, making it computationally efficient and capable of showing surface parameter dependencies explicitly. The first-order CC-scatter solution is shown to satisfy reciprocity, to comply with a pattern symmetry relation, and to be accurate over a wide range of surface parameters. The theory is also shown to be capable of quantifying its field errors resulting in an error criterion that is derived from the theory itself (which is not generally available in other theories). Radar cross sections for random rough surfaces with Gaussian statistics are compared to data generated by solving the electric field integral equation using the method of moments. Good agreement was shown to result for a wide range of surface parameters.
  • Keywords
    Gaussian processes; electromagnetic wave scattering; method of moments; radar cross-sections; rough surfaces; Gaussian statistics; correction current method; electric field integral equation; first-order scatter pattern; full wave theory; method of moments; plane wave scattering; radar cross sections; rough dielectric surfaces; surface parameter dependencies; Dielectrics; Polarization; Radar cross section; Radar scattering; Rough surfaces; Scattering parameters; Statistics; Surface roughness; Surface waves; Tellurium; Correction current (CC) method; rough dielectric surface scattering; rough surface scattering;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2008.924722
  • Filename
    4558325