DocumentCode

783063

Title

Semiconductor Fast-Neutron Dosimeter with Low Threshold of Sensitivity

Author

Kramer, Gordon

Author_Institution

Battelle Memorial Institute Columbus Laboratories Columbus, Ohio

Volume

14

Issue

1

fYear

1967

Firstpage

365

Lastpage

371

Keywords

Biomedical measurements; Biomedical monitoring; Boron; Charge carrier lifetime; Degradation; Lattices; Lithium; Neutrons; Silicon; Temperature;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1967.4324440

Filename

4324440