DocumentCode :
783196
Title :
Measuring the best linear approximation of systems suffering nonlinear distortions: an alternative method
Author :
Solomou, Michael ; Rees, David
Author_Institution :
Sch. of Electron., Univ. of Glamorgan, Wales, UK
Volume :
52
Issue :
4
fYear :
2003
Firstpage :
1114
Lastpage :
1119
Abstract :
When measuring the best linear approximation of systems suffering nonlinear distortions, a specific class of periodic multiharmonic signals is normally used. These are signals with uniformly distributed random phases, termed random phase multisines. In this paper, it is shown that measurements of the best linear approximation of nonlinear systems can also be obtained by using a special type of low crest factor multisines. These signals are compared to random phase multisines and their properties are analyzed in detail.
Keywords :
identification; measurement theory; nonlinear distortion; nonlinear systems; best linear approximation; linear frequency response function measurements; low crest factor multisines; nonlinear distortions; nonlinear systems; periodic multiharmonic signals; system identification; Distortion measurement; Frequency estimation; Frequency measurement; Linear approximation; Nonlinear distortion; Nonlinear systems; Phase measurement; Signal analysis; Signal processing; Vectors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.815983
Filename :
1232354
Link To Document :
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