• DocumentCode
    783333
  • Title

    An application of embedology to spatio-temporal pattern recognition

  • Author

    Stright, James R. ; Rogers, Steven K. ; Quinn, Dennis W. ; Fielding, Kenneth H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • Volume
    32
  • Issue
    2
  • fYear
    1996
  • fDate
    4/1/1996 12:00:00 AM
  • Firstpage
    768
  • Lastpage
    774
  • Abstract
    The theory of embedded time series is shown applicable for determining a reasonable lower bound on the length of test sequence required for accurate classification of moving objects. Sequentially recorded feature vectors of a moving object form a training trajectory in feature space. Each of the sequences of feature vector components is a time series, and under certain conditions, each of these time series has approximately the same fractal dimension. The embedding theorem may be applied to this fractal dimension to establish a sufficient number of observations to determine the feature space trajectory of the object. It is argued that this number is a reasonable lower bound on test sequence length for use in object classification. Experiments with data corresponding to five military vehicles (observed following a projected Lorenz trajectory on a viewing sphere) show that this bound is indeed adequate.
  • Keywords
    feature extraction; fractals; hidden Markov models; military systems; pattern classification; time series; classification; embedding theorem; embedology; feature space; fractal dimension; lower bound; military vehicles; moving object; object classification; projected Lorenz trajectory; sequentially recorded feature vectors; spatio-temporal pattern recognition; test sequence; test sequence length; time series; training trajectory; viewing sphere; Aerospace testing; Fractals; Hidden Markov models; Image sequences; Land surface; Military computing; Nearest neighbor searches; Pattern recognition; Space technology; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.489519
  • Filename
    489519