Title :
Survey of Materials for Radiation Detection at Elevated Temperatures
Author :
Prince, M.B. ; Polishuk, P.
Author_Institution :
Electro-Optical Systems, Inc. Pasadena, California a Subsidiary of Xerox Corporation
Keywords :
Conductivity; Dielectric materials; Equations; Force measurement; Radiation detectors; Radioactive materials; Semiconductor materials; Semiconductor radiation detectors; Silicon; Temperature distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1967.4324467
