Title :
Improved 1-kHz capacitance calibration uncertainty
Author :
Jeffery, Anne-Marie ; Koffman, Andrew D.
Author_Institution :
Electricity Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Uncertainties for 1-kHz capacitance calibrations have been decreased at the National Institute of Standards and Technology (NIST). The improvements are based on frequency-dependence characterization from 1592 Hz to 1 kHz. The relevant measurements and the traceability procedures from the calculable capacitor to the customer calibration are described.
Keywords :
calibration; capacitance measurement; measurement uncertainty; 1592 Hz to 1 kHz; capacitance calibration; frequency dependence; measurement uncertainty; traceability; Bridge circuits; Calibration; Capacitance measurement; Capacitors; Electrical resistance measurement; Frequency measurement; Impedance; Laboratories; Measurement uncertainty; NIST;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.816810
