DocumentCode :
783498
Title :
A compact low noise operational amplifier for a 1.2 μm digital CMOS technology
Author :
Holman, W. Timothy ; Connelly, J. Alvin
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
30
Issue :
6
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
710
Lastpage :
714
Abstract :
A compact low noise operational amplifier using lateral p-n-p bipolar transistors in the input stage has been fabricated in a standard 1.2 μm digital n-well CMOS process. Like their n-p-n counterparts in p-well processes, these lateral p-n-p transistors exhibit low 1/f noise and good lateral β. The fabricated op amp has an area of only 0.211 mm2 with En=3.2 nV/√(Hz), In=0.73 pA/√(Hz), En and In 1/f noise corner frequencies less than 100 Hz, a -3 dB bandwidth greater than 10 MHz with a closed loop gain of 20.8 dB, a minimum PSRR (DC) of 68 dB, a CMRR (DC) of 100 dB, a minimum output slew rate of 39 V/μs, and a quiescent current of 2.1 mA at supply voltages of ±2.5 V. The operational amplifier drives a 1 kΩ resistive load to 1 V peak-to-peak at 10 MHz and has been used as a versatile building block for mixed-signal IC designs
Keywords :
1/f noise; CMOS analogue integrated circuits; integrated circuit noise; operational amplifiers; -2.5 V; 1.2 micron; 10 MHz; 2.1 mA; 2.5 V; 20.8 dB; compact low noise op amp; digital CMOS technology; digital n-well CMOS process; lateral p-n-p bipolar transistors; low 1/f noise; mixed-signal IC building block; operational amplifier; Bipolar transistors; CMOS process; CMOS technology; Circuit noise; Frequency; Gain; Integrated circuit noise; Low-noise amplifiers; MOSFETs; Operational amplifiers;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.387078
Filename :
387078
Link To Document :
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