• DocumentCode
    783551
  • Title

    Leakage Current Reduction Using Subthreshold Source-Coupled Logic

  • Author

    Tajalli, Armin ; Leblebici, Yusuf

  • Author_Institution
    Microelectron. Syst. Lab. (LSM), Swiss Fed. Inst. of Technol. (EPFL), Lausanne
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    374
  • Lastpage
    378
  • Abstract
    The performance of subthreshold source-coupled logic (STSCL) circuits for ultra-low-power applications is explored. It is shown that the power consumption of STSCL circuits can be reduced well below the subthreshold leakage current of static CMOS circuits. STSCL circuits exhibit a better power-delay performance compared with their static CMOS counterparts in situations where the leakage current constitutes a significant part of the power dissipation of static CMOS gates. The superior control on power consumption, in addition to the lower sensitivity to the process and supply voltage variations, makes the STSCL topology very suitable for implementing ultra-low-power low-frequency digital systems in modern nanometer-scale technologies. An analytical approach for comparing the power-delay performance of these two topologies is proposed.
  • Keywords
    CMOS logic circuits; leakage currents; low-power electronics; leakage current reduction; power consumption; power dissipation; static CMOS circuits; static CMOS gates; subthreshold source-coupled logic circuits; ultra-low-power applications; CMOS digital circuits; leakage; source-coupled logic (SCL); subthreshold CMOS; subthreshold SCL (STSCL);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2009.2019167
  • Filename
    4895230