DocumentCode
783551
Title
Leakage Current Reduction Using Subthreshold Source-Coupled Logic
Author
Tajalli, Armin ; Leblebici, Yusuf
Author_Institution
Microelectron. Syst. Lab. (LSM), Swiss Fed. Inst. of Technol. (EPFL), Lausanne
Volume
56
Issue
5
fYear
2009
fDate
5/1/2009 12:00:00 AM
Firstpage
374
Lastpage
378
Abstract
The performance of subthreshold source-coupled logic (STSCL) circuits for ultra-low-power applications is explored. It is shown that the power consumption of STSCL circuits can be reduced well below the subthreshold leakage current of static CMOS circuits. STSCL circuits exhibit a better power-delay performance compared with their static CMOS counterparts in situations where the leakage current constitutes a significant part of the power dissipation of static CMOS gates. The superior control on power consumption, in addition to the lower sensitivity to the process and supply voltage variations, makes the STSCL topology very suitable for implementing ultra-low-power low-frequency digital systems in modern nanometer-scale technologies. An analytical approach for comparing the power-delay performance of these two topologies is proposed.
Keywords
CMOS logic circuits; leakage currents; low-power electronics; leakage current reduction; power consumption; power dissipation; static CMOS circuits; static CMOS gates; subthreshold source-coupled logic circuits; ultra-low-power applications; CMOS digital circuits; leakage; source-coupled logic (SCL); subthreshold CMOS; subthreshold SCL (STSCL);
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2009.2019167
Filename
4895230
Link To Document