Title :
Paraxial and source region behavior of a class of asymptotic and rigorous (MoM) solutions in the high-frequency planar limit
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Univ. of Missouri-Kansas City, Kansas City, MO, USA
fDate :
6/27/1905 12:00:00 AM
Abstract :
Mutual impedance between flush-mounted antennas on convex surfaces has been traditionally computed at high frequencies using the uniform theory of diffraction (UTD) and other high-frequency asymptotic solutions. Motivated by a recent study, the limits of applicability of the existing asymptotic techniques to the calculation of input (or self-) impedance are investigated here. It is shown analytically that UTD and one other asymptotic formulation, in the close vicinity of a source on a perfectly electrically conducting (PEC) circular cylinder, for negligible local surface curvatures, are algebraically identical. For the canonical geometry of an axial magnetic current element on a PEC circular cylinder, it is shown that the additional paraxial correction term in the UTD formulation vanishes in the high-frequency planar limit. Numerical comparisons against rigorous method of moments (MoM) solutions show that the reduced-planar forms are remarkably accurate for source-to-observer separations, t, where 0.02λo≤t≤0.08λo, and slightly off the axial direction.
Keywords :
conducting bodies; conformal antennas; geometrical theory of diffraction; method of moments; MoM; UTD; asymptotic-rigorous solutions; axial magnetic current element; canonical geometry; flush-mounted antennas; high-frequency planar limit; method of moments; mutual impedance; paraxial-source region behavior; perfectly electrically conducting circular cylinder; uniform theory of diffraction; Cities and towns; Engine cylinders; Geometry; Magnetic analysis; Magnetic fields; Message-oriented middleware; Moment methods; Mutual coupling; Physical theory of diffraction; Surface impedance; Asymptotic; Fock parameter; input impedance; paraxial; planar; source;
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
DOI :
10.1109/LAWP.2005.844140