Title :
A quasi-two-dimensional HEMT model for microwave CAD applications
Author :
Drury, Robert ; Snowden, Christopher M.
Author_Institution :
Dept. of Electron. & Electr. Eng., Leeds Univ., UK
fDate :
6/1/1995 12:00:00 AM
Abstract :
A new quasi-two-dimensional HEMT model has been developed that solves the physical device equations in a more rigorous fashion than previously reported. The model incorporates a quantum mechanical description of the free electron concentration, self-consistently solving the Schrodinger and Poisson equations. The influence of traps and incomplete donor ionization are also included. The conventional one-dimensional charge-control approach is shown to be inadequate for HEMT´s and is replaced by a two-dimensional version that more accurately describes the channel dynamics under normal bias conditions. This allows the simulation to accurately model pinch-off characteristics, which are essential for digital, power and low-noise device characterization. The scheme also includes a detailed energy transport model, avalanche breakdown and gate conduction terms. The highly efficient model is applied to the DC and microwave characterization of AlGaAs-GaAs and pseudomorphic HEMT´s
Keywords :
CAD; Schrodinger equation; avalanche breakdown; electron density; electron traps; electronic engineering computing; high electron mobility transistors; hole traps; microwave field effect transistors; semiconductor device models; AlGaAs-GaAs; Poisson equation; Schrodinger equation; avalanche breakdown; channel dynamics; donor ionization; energy transport model; free electron concentration; gate conduction; microwave CAD applications; microwave characterization; normal bias conditions; physical device equations; pinchoff characteristics; pseudomorphic HEMT; quantum mechanical description; quasi-2D HEMT model; quasi-two-dimensional model; simulation; traps; Computational modeling; Electrons; HEMTs; MESFETs; Microwave FETs; Microwave devices; Microwave measurements; Poisson equations; Quantum mechanics; Semiconductor process modeling;
Journal_Title :
Electron Devices, IEEE Transactions on