Dynamic characterization of scan conversion-based transient digitizers

Author

Arpaia, Pasquale ; Cennamo, Felice ; Daponte, Pasquale ; Apuzzo, Massimo D.

Author_Institution

Dipartimento di Ingegneria Elettrica, Naples Univ., Italy

Volume

44

Issue

3

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

643

Lastpage

646

Abstract

This paper deals with a method for the dynamic characterization of scan conversion-based transient digitizers. Such a method is based on the application to the digitized data of a two-dimensional filtering process, implemented by using the Walsh transform. The filtering process avoids incorrect evaluation of the digitizer dynamic performance. In order to test the proposed method, a scan converter model has been also developed. The validity and the application range of the method are illustrated through numerical and experimental results

Keywords

Walsh functions; filtering theory; image processing; quantisation (signal); transients; Walsh transform; digitized data; digitizer dynamic performance; dynamic characterization; incorrect evaluation; scan conversion-based transient digitizers; scan converter model; two-dimensional filtering; Circuit testing; Electron beams; Filtering; Image converters; Matrix converters; Semiconductor device noise; Semiconductor diodes; Signal processing; Very large scale integration; Writing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.387299

Filename

387299