DocumentCode :
784718
Title :
A Broadband Volume Integral Formulation Based on Edge-Elements for Full-Wave Analysis of Lossy Interconnects
Author :
Rubinacci, Guglielmo ; Tamburrino, Antonello
Author_Institution :
Dipt. di Ingegneria Elettrica, Univ. Federico II, Napoli
Volume :
54
Issue :
10
fYear :
2006
Firstpage :
2977
Lastpage :
2989
Abstract :
A new numerical fully three-dimensional (3-D) volume integral formulation for the electromagnetic analysis from static to microwave frequencies of penetrable materials (dielectric, eventually lossy, and conductors with finite conductivity) is here discussed. Its key feature is the introduction of a volumetric loop-star decomposition for treating piecewise homogeneous materials. The associated shape functions have been determined to decompose the volume current density in a solenoidal and a nonsolenoidal part, in analogy to the surface loop-star shape functions, used for modeling surface current densities on perfect electric conductors. The possibility of modeling volumetric ohmic and polarization current densities allows to compute in an accurate way the electromagnetic field in complex 3-D geometries, such as high speed interconnects, on a broad range of frequencies
Keywords :
conducting bodies; current density; electromagnetic wave polarisation; 3-D geometry; broadband volume integral formulation; edge-element; electromagnetic analysis; electromagnetic field; full-wave analysis; lossy interconnects; microwave frequency; perfect electric conductor; piecewise homogeneous material; polarization current density; surface loop-star shape function; volumetric loop-star decomposition; volumetric ohmic current density; Conducting materials; Conductivity; Current density; Dielectric losses; Dielectric materials; Electromagnetic analysis; Integral equations; Microwave frequencies; Shape; Surface treatment; Full wave analysis; integral equations; interconnect structures; loop-star decomposition;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2006.882156
Filename :
1707936
Link To Document :
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