DocumentCode
784774
Title
Effects of strain on the critical current of Bi-2223/Ag tapes
Author
Kitaguchi, Hitoshi ; Nishioka, Jun-ichi ; Hasegawa, Takayo ; Itoh, Kikuo ; Kumakura, Hiroaki ; Togano, Kazumasa ; Wada, Hitoshi
Author_Institution
Mater. Eng. Lab, Nat. Inst. for Mater. Sci., Tsukuba, Japan
Volume
12
Issue
1
fYear
2002
fDate
3/1/2002 12:00:00 AM
Firstpage
1141
Lastpage
1144
Abstract
The influence of mechanical strain on the critical current (IC) is investigated for multi-filamentary Bi-2223/Ag/Ag-0.2wt%Mg-0.3wt%Sb superconducting tapes at liquid nitrogen temperature, 77 K. Several kinds of Bi-2223/Ag tapes with different Ag/SC ratio (2.0, 2.2, and 2.6) and/or number of filaments (19 and 37) are examined. Bending and tensile deformation tests are performed. In the bending deformation tests, decrease of IC is observed for the all samples with bending strain above 0.3% and 0.4% in the tests for bent samples and bent-and-re-straightened samples, respectively. The decrease of IC is the most sensitive on the bending strain in the 19-filament samples with Ag/SC ratio of 2.0 and the least sensitive in the 37-filament samples with Ag/SC ratio of 2.2. Strain tolerance in the tensile deformation tests varies depending on the number of filaments, although the strain tolerance is similar for the samples with the same number of filaments and different Ag/SC ratio. Large decrease of IC is observed for 19-filament and 37-filament samples with Ag/SC ratio of 2.2 at tensile strain above 0.17% and 0.23%, respectively (the tensile strain is the deformation from as-cooled state on Ti-6wt%Al-4wt%V holder). Higher Ag/SC ratio and fine filament are effective to improve the durability against deformation.
Keywords
bending; bismuth compounds; calcium compounds; critical currents; high-temperature superconductors; multifilamentary superconductors; silver; strontium compounds; superconducting tapes; 77 K; Bi-2223/Ag multifilamentary tape; Bi2Sr2Ca2Cu3O-Ag; bending deformation; critical current; high temperature superconductor; mechanical strain; tensile deformation; Bismuth; Capacitive sensors; Conductors; Critical current; Magnetic field induced strain; Magnetic materials; Strontium; Tensile strain; Tensile stress; Testing;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2002.1018603
Filename
1018603
Link To Document