• DocumentCode
    784966
  • Title

    ESD-Protected Wideband CMOS LNAs Using Modified Resistive Feedback Techniques With Chip-on-Board Packaging

  • Author

    Chang, Tienyu ; Chen, Jinghong ; Rigge, Lawrence A. ; Lin, Jenshan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL
  • Volume
    56
  • Issue
    8
  • fYear
    2008
  • Firstpage
    1817
  • Lastpage
    1826
  • Abstract
    A novel modified resistive feedback structure for designing wideband low-noise amplifiers (LNAs) is proposed and demonstrated in this paper. Techniques including feedback through a source follower, an R-C feedback network, a gate peaking inductor inside the feedback loop, and neutralization capacitors are used. Bond-wire inductors and electrostatic devices (ESDs) are co-designed to improve the chip performance. Two LNAs, LNA1 and LNA2, were fabricated using a TSMC digital 90-nm CMOS technology. Both chips were tested on board using chip-on-board packages with ESD diodes added at the inputs and outputs. LNA1 achieves a 3-dB bandwidth of 9 GHz with 10 dB of power gain and a minimum noise figure (NF) of 4.2 dB. LNA2 achieves a 3-dB bandwidth of 3.2 GHz with 15.5 dB of power gain and a minimum NF of 1.76 dB. The two LNAs have third-order intermodulation intercept points of 8 and 9 dBm. Their power consumptions are 20 and 25 mW with a 1.2-V supply, respectively.
  • Keywords
    CMOS integrated circuits; chip-on-board packaging; electrostatic devices; low noise amplifiers; ultra wideband technology; ESD-protected wideband CMOS LNA; bond-wire inductors; chip-on-board packaging; electrostatic devices; modified resistive feedback techniques; multiband receivers; third-order intermodulation intercept points; wideband low-noise amplifiers; CMOS; electrostatic devices (ESDs); low-noise amplifier (LNA); multiband receiver; resistive feedback; ultra-wideband (UWB);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.927301
  • Filename
    4560051