Application of scanning tunneling microscope to high-speed optical sampling measurement

Author

Takeuchi, Koichiro ; Mizuhara, Akira ; Kasahara, Yukio

Author_Institution

Teratec Corp., Tokyo, Japan

Volume

44

Issue

3

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

815

Lastpage

818

Abstract

A novel method of measuring high-speed electrical waveforms using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train is used to turn on and off the photoconductive semiconductor switch (PCSS) on the STM probe to measure a high-speed signal in an equivalent sampling procedure. A temporal resolution of 160 ps has been achieved. This unique combination of optical sampling and STM technology is a breakthrough for measuring ultra-high-speed waveforms

Keywords

high-speed optical techniques; photoconducting switches; scanning tunnelling microscopy; signal sampling; spectral analysers; wave analysers; waveform analysis; 160 ps; STM probe; equivalent sampling procedure; high-speed electrical waveforms; high-speed optical sampling measurement; high-speed signal; optical pulse train; optical sampling; photoconductive semiconductor switch; scanning tunneling microscope; temporal resolution; ultra-high-speed waveforms; Electric variables measurement; High speed optical techniques; Optical microscopy; Optical pulses; Optical switches; Photoconducting devices; Probes; Pulse measurements; Sampling methods; Tunneling;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.387340

Filename

387340