Particle analyzer system based on microwave-induced plasma technology

Author

Takahara, Hisao ; Iwasaki, Motoaki ; Tanibata, Yasuhiro

Author_Institution

Yokogawa Electr. Corp., Tokyo, Japan

Volume

44

Issue

3

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

819

Lastpage

823

Abstract

We have developed a new particle analyzing system, the PT1000, the world´s first such system based on microwave-induced plasma (MIP) technology. This system provides three-dimensional information: the composition and size of each particulate, and their number and distribution. The measuring principle is that particulates collected on the filter are introduced in turn into the center of the high-temperature, atmospheric pressure He-MIP by an aspirator, evaporated instantaneously and atomized, ionized, then further excited. The emission spectrum accompanying this excitation enters four spectroscopes through optical fibers. Elements in the particulates are determined from the wave lengths set on the spectroscopes, the number of particulates from the number of peaks, the particle size from the peak height, and the composition from the synchronizing emission

Keywords

computerised instrumentation; excited states; helium neutral atoms; ionisation; plasma applications; spectrochemical analysis; spectroscopy computing; He; PT1000; aspirator; atmospheric pressure He-MIP; composition; emission spectrum; microwave-induced plasma technology; optical fibers; particle analyzing system; particle size; peak height; synchronizing emission; three-dimensional information; Atmospheric measurements; Atmospheric waves; Atmospheric-pressure plasmas; Atomic measurements; Microwave technology; Optical fiber filters; Particle measurements; Plasma measurements; Pressure measurement; Spectroscopy;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.387341

Filename

387341