Title :
Addition to "ADC testing"
Author :
Linnenbrink, T.E. ; Blair, J. ; Rapuano, S. ; Daponte, P. ; Balestrieri, E. ; Vito, L. De ; Max, S. ; Tilden, S.J.
Abstract :
In the April 2006 issue of IEEE Instrumentation and Measurement Magazine, "ADC Testing," the seventh in a series of tutorials on instrumentation and measurements, was presented. The authors have created a table that summarizes the parameters that are extracted from each ADC test setup that was presented in the tutorial. It is an easy reference guide for readers to find the topic they are researching
Keywords :
analogue-digital conversion; electronic equipment testing; ADC test setup; ADC testing; Apertures; Bandwidth; Feedback loop; Instrumentation and measurement; Intermodulation distortion; Propagation delay; Testing; Uncertainty;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2006.1708350
