Title :
Simple Expression of Field Nonuniformity Factor for Hemispherically Capped Rod-Plane Gaps
Author_Institution :
Xi´´an Jiaotong University China
Abstract :
This communication compiles published computed data of the field nonuniformity factor for hemispherically capped rod-plane gaps, and presents two simple expressions for gaps with the ratio of gap length to rod radius ranging from 1 to 500.
Keywords :
Computational modeling; Corona; Dielectric breakdown; Dielectrics and electrical insulation; Distributed computing; Electrodes; Finite element methods; Optimization methods; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1986.348977
