DocumentCode :
785818
Title :
A predictive distributed congestion metric with application to technology mapping
Author :
Shelar, Rupesh S. ; Sapatnekar, Sachin S. ; Saxena, Prashant ; Wang, Xinning
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Volume :
24
Issue :
5
fYear :
2005
fDate :
5/1/2005 12:00:00 AM
Firstpage :
696
Lastpage :
710
Abstract :
Due to increasing design complexities, routing congestion has become a critical problem in very large scale integration designs. This paper introduces a distributed metric to predict routing congestion and applies it to technology mapping that targets area and delay optimization. Our technology mapping algorithms are guided by a probabilistic congestion map for the subject graph to identify the congested regions, where congestion-optimal matches are favored. Experimental results on a set of benchmark circuits in a 90-nm technology show that congestion-aware mapping results in a reduction of 37%, on an average, in track overflows with marginal gate-area penalty as compared to conventional area-oriented technology mapping. For delay-oriented mapping, our algorithm improves track overflows by 20%, on an average, in addition to preserving or improving the delay, as compared to the conventional method.
Keywords :
VLSI; circuit complexity; circuit optimisation; integrated circuit layout; logic design; nanoelectronics; network routing; 90 nm; VLSI; area optimization; area-oriented technology mapping; congestion estimation; congestion-aware mapping; congestion-optimal matching; delay optimization; delay-oriented technology mapping; design complexity; logic synthesis; marginal gate-area penalty; physical design; predictive distributed congestion metric; probabilistic congestion map; routing congestion prediction; subject graph; very large scale integration design; Delay estimation; Integrated circuit interconnections; Logic design; Moore´s Law; Routing; Timing; Transistors; Very large scale integration; Wires; Wiring; Congestion estimation; logic synthesis; physical design; placement; routing congestion; technology mapping;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2005.846368
Filename :
1424173
Link To Document :
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