• DocumentCode
    785818
  • Title

    A predictive distributed congestion metric with application to technology mapping

  • Author

    Shelar, Rupesh S. ; Sapatnekar, Sachin S. ; Saxena, Prashant ; Wang, Xinning

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • Volume
    24
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    696
  • Lastpage
    710
  • Abstract
    Due to increasing design complexities, routing congestion has become a critical problem in very large scale integration designs. This paper introduces a distributed metric to predict routing congestion and applies it to technology mapping that targets area and delay optimization. Our technology mapping algorithms are guided by a probabilistic congestion map for the subject graph to identify the congested regions, where congestion-optimal matches are favored. Experimental results on a set of benchmark circuits in a 90-nm technology show that congestion-aware mapping results in a reduction of 37%, on an average, in track overflows with marginal gate-area penalty as compared to conventional area-oriented technology mapping. For delay-oriented mapping, our algorithm improves track overflows by 20%, on an average, in addition to preserving or improving the delay, as compared to the conventional method.
  • Keywords
    VLSI; circuit complexity; circuit optimisation; integrated circuit layout; logic design; nanoelectronics; network routing; 90 nm; VLSI; area optimization; area-oriented technology mapping; congestion estimation; congestion-aware mapping; congestion-optimal matching; delay optimization; delay-oriented technology mapping; design complexity; logic synthesis; marginal gate-area penalty; physical design; predictive distributed congestion metric; probabilistic congestion map; routing congestion prediction; subject graph; very large scale integration design; Delay estimation; Integrated circuit interconnections; Logic design; Moore´s Law; Routing; Timing; Transistors; Very large scale integration; Wires; Wiring; Congestion estimation; logic synthesis; physical design; placement; routing congestion; technology mapping;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.846368
  • Filename
    1424173