DocumentCode :
785873
Title :
Fast Measurement Techniques for Research in Dielectrics
Author :
Pfeiffer, W.
Author_Institution :
Technische Hochschule Darmstadt, Germany
Issue :
5
fYear :
1986
Firstpage :
763
Lastpage :
780
Abstract :
Measurement techniques for research in dielectrics require very fast time resolution and extremely wide dynamic ranges. Additionally, the measured quantities may be very low in amplitude. These conditions can be met only partly by electrical measuring systems. Additionally, two-dimenstional or even three-dimensional spatial information concerning the prebreakdown phenomena is highly desirable. This can only be achieved by optical measuring systems, which also may provide other advantages. In order to provide adequate time resolution, only coaxial measuring systems are considered. These consist of voltage probes using ohmic or capacitive networks and electro-optical devices. For current measurements ohmic shunts are compared with inductive probes and optical current probes. Optical measurement techniques based on high-speed photography are described in detail. In this context, the widely used streak-cameras are compared with framing cameras. It is obvious that research in dielectrics requires special highspeed recording systems which are not readily available. Together with recent image recording systems, however, very precise optical measurements are possible.
Keywords :
Coaxial components; Dielectric measurements; Dynamic range; Electric variables measurement; High speed optical techniques; Measurement techniques; Optical recording; Probes; Spatial resolution; Ultraviolet sources;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1986.348924
Filename :
4157062
Link To Document :
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