• DocumentCode
    785914
  • Title

    Analysis and simulation of a mid-infrared P+-InAs0.55Sb0.15P0.30/n0-InAs0.89Sb0.11/N+-InAs0.55Sb0.15P0.30 double heterojunction photod

  • Author

    Chakrabarti, P. ; Krier, A. ; Morgan, A.F.

  • Author_Institution
    Dept. of Electron. Eng., Banaras Hindu Univ., Varanasi, India
  • Volume
    50
  • Issue
    10
  • fYear
    2003
  • Firstpage
    2049
  • Lastpage
    2058
  • Abstract
    A photovoltaic detector based on an N+-InAs0.55Sb0.15P0.30/n0-InAs0.89Sb0.$ d11/P+-InAs0.55Sb0.15P0.30 double heterostructure (DH) suitable for operation in the mid-infrared (MIR) spectral region (2 to 5 μm) at room temperature has been studied. A physics based closed form model of the device has been developed to investigate the relative importance of the different mechanisms which determine dark current and photoresponse. The results obtained on the basis of the model have been compared and contrasted with those obtained from experimental measurements on DH detectors fabricated previously in our laboratory using liquid phase epitaxy (LPE). The model helps to explain the various physical mechanisms that shape the characteristics of the device under room temperature operation. It can also be used to optimize the performance of the photodetector in respect of dark current, responsivity and detectivity. A comparison of theoretical predictions and experimental results revealed that Shockley-Read-Hall (SRH) recombination is more important than Auger recombination in determining the room temperature detector performance when the concentration of nonradiative recombination centers in our material exceeds 1017 cm-3. Furthermore, compositional grading in the cladding regions of the double heterostructure has been found to be responsible for the reduction of the detectivity of the device in the shorter wavelength region.
  • Keywords
    III-V semiconductors; electron-hole recombination; indium compounds; infrared detectors; liquid phase epitaxial growth; photodetectors; semiconductor device models; simulation; surface recombination; tunnelling; 2 to 5 micron; Auger recombination; InAs0.55Sb0.15P0.30-InAs0.89Sb0.11InAs0.55Sb0.15P0.30; LPE; Shockley-Read-Hall recombination; cladding regions; compositional grading; dark current; depletion region; detectivity; double heterojunction photodetector; double heterostructure; liquid phase epitaxy; mid-infrared spectral region; nonradiative recombination centers; photoresponse; photovoltaic detector; physical mechanisms; physics based closed form model; responsivity; room temperature detector performance; room temperature operation; Analytical models; DH-HEMTs; Dark current; Detectors; Photovoltaic systems; Physics; Region 2; Semiconductor process modeling; Solar power generation; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2003.815604
  • Filename
    1232923