DocumentCode :
785914
Title :
Analysis and simulation of a mid-infrared P+-InAs0.55Sb0.15P0.30/n0-InAs0.89Sb0.11/N+-InAs0.55Sb0.15P0.30 double heterojunction photod
Author :
Chakrabarti, P. ; Krier, A. ; Morgan, A.F.
Author_Institution :
Dept. of Electron. Eng., Banaras Hindu Univ., Varanasi, India
Volume :
50
Issue :
10
fYear :
2003
Firstpage :
2049
Lastpage :
2058
Abstract :
A photovoltaic detector based on an N+-InAs0.55Sb0.15P0.30/n0-InAs0.89Sb0.$ d11/P+-InAs0.55Sb0.15P0.30 double heterostructure (DH) suitable for operation in the mid-infrared (MIR) spectral region (2 to 5 μm) at room temperature has been studied. A physics based closed form model of the device has been developed to investigate the relative importance of the different mechanisms which determine dark current and photoresponse. The results obtained on the basis of the model have been compared and contrasted with those obtained from experimental measurements on DH detectors fabricated previously in our laboratory using liquid phase epitaxy (LPE). The model helps to explain the various physical mechanisms that shape the characteristics of the device under room temperature operation. It can also be used to optimize the performance of the photodetector in respect of dark current, responsivity and detectivity. A comparison of theoretical predictions and experimental results revealed that Shockley-Read-Hall (SRH) recombination is more important than Auger recombination in determining the room temperature detector performance when the concentration of nonradiative recombination centers in our material exceeds 1017 cm-3. Furthermore, compositional grading in the cladding regions of the double heterostructure has been found to be responsible for the reduction of the detectivity of the device in the shorter wavelength region.
Keywords :
III-V semiconductors; electron-hole recombination; indium compounds; infrared detectors; liquid phase epitaxial growth; photodetectors; semiconductor device models; simulation; surface recombination; tunnelling; 2 to 5 micron; Auger recombination; InAs0.55Sb0.15P0.30-InAs0.89Sb0.11InAs0.55Sb0.15P0.30; LPE; Shockley-Read-Hall recombination; cladding regions; compositional grading; dark current; depletion region; detectivity; double heterojunction photodetector; double heterostructure; liquid phase epitaxy; mid-infrared spectral region; nonradiative recombination centers; photoresponse; photovoltaic detector; physical mechanisms; physics based closed form model; responsivity; room temperature detector performance; room temperature operation; Analytical models; DH-HEMTs; Dark current; Detectors; Photovoltaic systems; Physics; Region 2; Semiconductor process modeling; Solar power generation; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2003.815604
Filename :
1232923
Link To Document :
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