DocumentCode :
786035
Title :
A physical compact model of DG MOSFET for mixed-signal circuit applications - part II: Parameter extraction
Author :
Pei, Gen ; Kan, Edwin Chih-Chuan
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Volume :
50
Issue :
10
fYear :
2003
Firstpage :
2144
Lastpage :
2153
Abstract :
For pt. see ibid., vol. 50, no. 10, p. 2135 (2003). Based on the physical double-gate MOSFET model described in Part I, we present a systematic parameter extraction methodology that avoids parameter interdependence between different physical effects whenever possible. Several extraction schemes are compared for precise modeling of small-signal and large-signal characteristics. The physical model and the extraction methodology are verified through the reproduction of the simulated drain current, incremental drain resistance, and transconductance per unit current, which are parameters of particular interest to mixed-signal circuit designs.
Keywords :
MOSFET; carrier mobility; parameter estimation; semiconductor device models; DG MOSFET; incremental drain resistance; large-signal characteristics; mixed-signal circuit applications; physical compact model; physical effects; precise modeling; simulated drain current; small-signal characteristics; systematic parameter extraction methodology; transconductance; Circuit simulation; Circuit synthesis; Doping; MOSFET circuits; Parameter extraction; Semiconductor process modeling; Solid modeling; Temperature; Threshold voltage; Transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2003.817480
Filename :
1232935
Link To Document :
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