DocumentCode
786235
Title
Subpixel edge location in binary images using dithering
Author
Liu, Xiangdong ; Ehrich, Roger W.
Author_Institution
Dept. of Comput. Sci., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume
17
Issue
6
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
629
Lastpage
634
Abstract
This paper concerns the problem of obtaining subpixel estimates of the locations of straight edges in binary digital images using dithering. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and implementation is discussed
Keywords
edge detection; random noise; binary images; dithering; subpixel edge location; subpixel estimates; uniformly distributed independent random noise; Computer vision; Digital images; Image reconstruction; Image storage; Inspection; Intelligent sensors; Pattern analysis; Pattern recognition; Position measurement; Writing;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.387511
Filename
387511
Link To Document