• DocumentCode
    786243
  • Title

    Carrier Mobility Measurement

  • Author

    Yoshino, K.

  • Author_Institution
    Faculty of Engineering, Osaka University, Yamada-Oka, Suita, Osaka, Japan
  • Issue
    6
  • fYear
    1986
  • Firstpage
    999
  • Lastpage
    1006
  • Abstract
    Various techniques will be discussed for the evaluation of the carrier mobility such as a time-of-flight method, a transient ient current observation, a surface potential decay method, galvanomagnetic effects and a breakdown time-lag measurement. Their applications to various materials, polymers, liquids, and liquid crystals will be pointed out. Especially, it has been revealed that the carrier mobility in polymers is strongly y dependent on both the measuring technique and the time range of interest: this is interpreted in terms of non-Gaussian carrier transport and severe influence of morphology and impurities. Effects of elongation, doping, and heattreatment also are discussed.
  • Keywords
    Charge carrier density; Conducting materials; Current measurement; Electric breakdown; Electric variables measurement; Electrodes; Liquid crystal polymers; Liquid crystals; Plastic insulation; Surface morphology;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1986.349014
  • Filename
    4157100