DocumentCode :
786243
Title :
Carrier Mobility Measurement
Author :
Yoshino, K.
Author_Institution :
Faculty of Engineering, Osaka University, Yamada-Oka, Suita, Osaka, Japan
Issue :
6
fYear :
1986
Firstpage :
999
Lastpage :
1006
Abstract :
Various techniques will be discussed for the evaluation of the carrier mobility such as a time-of-flight method, a transient ient current observation, a surface potential decay method, galvanomagnetic effects and a breakdown time-lag measurement. Their applications to various materials, polymers, liquids, and liquid crystals will be pointed out. Especially, it has been revealed that the carrier mobility in polymers is strongly y dependent on both the measuring technique and the time range of interest: this is interpreted in terms of non-Gaussian carrier transport and severe influence of morphology and impurities. Effects of elongation, doping, and heattreatment also are discussed.
Keywords :
Charge carrier density; Conducting materials; Current measurement; Electric breakdown; Electric variables measurement; Electrodes; Liquid crystal polymers; Liquid crystals; Plastic insulation; Surface morphology;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1986.349014
Filename :
4157100
Link To Document :
بازگشت