• DocumentCode
    786323
  • Title

    A third-order ΣΔ modulator in 0.18-μm CMOS with calibrated mixed-mode integrators

  • Author

    Shim, Jae Hoon ; Park, In-Cheol ; Kim, Beomsup

  • Author_Institution
    Electron. & Telecommun. Res. Inst., Daejeon, South Korea
  • Volume
    40
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    918
  • Lastpage
    925
  • Abstract
    This paper describes a third-order sigma-delta (ΣΔ) modulator that is designed and implemented in 0.18-μm CMOS process. In order to increase the dynamic range, this modulator takes advantage of mixed-mode integrators that consist of analog and digital integrators. A calibration technique is applied to the digital integrator to mitigate mismatch between analog and digital paths. It is shown that the presented modulator architecture can achieve a 12-dB better dynamic range than conventional structures with the same oversampling ratio (OSR). The experimental prototype chip achieves a 76-dB dynamic range for a 200-kHz signal bandwidth and a 55-dB dynamic range for a 5-MHz signal bandwidth. It dissipates 4 mW from 1.8-V supply voltages and occupies 0.7-mm2 silicon area.
  • Keywords
    CMOS integrated circuits; calibration; mixed analogue-digital integrated circuits; sigma-delta modulation; 0.18 micron; 1.8 V; 200 kHz; 4 mW; 5 MHz; CMOS process; analog integrators; analog-digital conversion; digital integrators; dynamic range; mixed-mode integrators; oversampling ratio; sigma-delta modulation; third-order ΣΔ modulator; Analog circuits; Bandwidth; Calibration; Circuit stability; Delta modulation; Delta-sigma modulation; Digital modulation; Dynamic range; Feedback loop; Voltage; Analog–digital conversion; calibration; sigma-delta modulation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2005.845558
  • Filename
    1424223