Title :
Electromagnetic Scattering Analysis of a Conductor Coated by Multilayer Thin Materials
Author :
Shifei Tao ; Zhenhong Fan ; Wenjing Liu ; Rushan Chen
Author_Institution :
Dept. of Commun. Eng., Nanjing Univ. of Sci. & Technol., Nanjing, China
Abstract :
In this letter, an efficient numerical approach for the electromagnetic scattering analysis of the conductor coated by multilayer thin materials for closed bodies is proposed. Only the induced current on the conductor is needed to be discretized as the unknowns, so the number of unknowns is independent with the number of dielectric coating layers. For the model of a conductor coated by multilayer thin materials, the electric field integral equation (EFIE) is presented and the multilevel fast multipole method (MLFMM) is utilized to speed up the matrix vector product after these equations converted to matrix equations with Galerkin testing. To validate this approach, several numerical examples are presented.
Keywords :
Galerkin method; conducting bodies; conductors (electric); dielectric thin films; electric current; electric field integral equations; electromagnetic wave scattering; multilayers; EFIE; Galerkin testing; MLFMM; conductor; dielectric coating layers; electric field integral equation; electromagnetic scattering analysis; induced current; matrix equations; matrix vector product; multilayer thin materials; multilevel fast multipole method; Coatings; Conductors; Dielectrics; Equations; Mathematical model; Nonhomogeneous media; Electric field integral equation (EFIE); multilayer thin coatings; scattering;
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
DOI :
10.1109/LAWP.2013.2277757