DocumentCode :
786762
Title :
Robust Boolean reasoning for equivalence checking and functional property verification
Author :
Kuehlmann, Andreas ; Paruthi, Viresh ; Krohm, Florian ; Ganai, Malay K.
Author_Institution :
Cadence Berkeley Labs, CA, USA
Volume :
21
Issue :
12
fYear :
2002
fDate :
12/1/2002 12:00:00 AM
Firstpage :
1377
Lastpage :
1394
Abstract :
Many tasks in computer-aided design (CAD), such as equivalence checking, property checking, logic synthesis, and false paths analysis, require efficient Boolean reasoning for problems derived from circuits. Traditionally, canonical representations, e.g., binary decision diagrams (BDDs), or structural satisfiability (SAT) methods, are used to solve different problem instances. Each of these techniques offer specific strengths that make them efficient for particular problem structures. However, neither structural techniques based on SAT, nor functional methods using BDDs offer an overall robust reasoning mechanism that works reliably for a broad set of applications. The authors present a combination of techniques for Boolean reasoning based on BDDs, structural transformations, an SAT procedure, and random simulation natively working on a shared graph representation of the problem. The described intertwined integration of the four techniques results in a powerful summation of their orthogonal strengths. The presented reasoning technique was mainly developed for formal equivalence checking and property verification but can equally be used in other CAD applications. The authors´ experiments demonstrate the effectiveness of the approach for a broad set of applications.
Keywords :
Boolean functions; binary decision diagrams; formal verification; logic CAD; Boolean reasoning; binary decision diagram; computer-aided design; equivalence checking; false path analysis; functional property verification; logic synthesis; orthogonal strength; random simulation; shared graph; structural satisfiability; structural transformation; Application software; Boolean functions; Circuit synthesis; Circuit testing; Data structures; Design automation; Logic circuits; Logic design; Logic testing; Robustness;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2002.804386
Filename :
1097859
Link To Document :
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