• DocumentCode
    786801
  • Title

    3-D Thermal-ADI: a linear-time chip level transient thermal simulator

  • Author

    Wang, Ting-Yuan ; Chen, Charlie Chung-Ping

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    21
  • Issue
    12
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    1434
  • Lastpage
    1445
  • Abstract
    Recent study shows that the nonuniform thermal distribution not only has an impact on the substrate but also interconnects. Hence, three-dimensional (3-D) thermal analysis is crucial to analyze these effects. In this paper, the authors present and develop an efficient 3-D transient thermal simulator based on the alternating direction implicit (ADI) method for temperature estimation in a 3-D environment. Their simulator, 3D Thermal-ADI, not only has a linear runtime and memory requirement, but also is unconditionally stable. Detailed analysis of the 3-D nonhomogeneous cases and boundary conditions for on-chip VLSI applications are introduced and presented. Extensive experimental results show that our algorithm is not only orders of magnitude faster than the traditional thermal simulation algorithms but also highly accurate and memory efficient. The temperature profile of steady state can also be reached in several iterations. This software will be released via the web for public usage.
  • Keywords
    VLSI; circuit simulation; finite difference methods; integrated circuit design; temperature distribution; thermal analysis; transient analysis; 3D Thermal-ADI; VLSI design; alternating direction implicit method; finite difference method; linear-time chip-level transient thermal simulator; temperature distribution; three-dimensional thermal analysis; Dielectric substrates; Energy consumption; Finite difference methods; Heating; Runtime; Silicon; Temperature distribution; Thermal factors; Thermal management; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2002.804385
  • Filename
    1097863