DocumentCode
787187
Title
Feeling uncertain about uncertainty? [Member Benefits]
Author
Ridler, Nick ; Yeou-Song Lee ; Blackham, David
Author_Institution
Nat. Phys. Lab., Teddington
Volume
9
Issue
4
fYear
2008
Firstpage
132
Lastpage
133
Abstract
The IEEE microwave theory and techniques society (MTT-S) "Microwave Measurements" committee has recently set up an online forum aimed at uncertainty and quality of measurement. The "Errors and Uncertainties for VNA Measurements" forum focuses on methods that can be used to evaluate errors and uncertainties in vector network analyzer (VNA) and VNA-related measurements, particularly at high frequencies (1 kHz to 1 THz).
Keywords
measurement errors; measurement uncertainty; microwave measurement; network analysers; IEEE Microwave Theory and Techniques Society microwave measurements; VNA measurements; errors; uncertainty measurement; vector network analyzer; Argon; Density measurement; Frequency measurement; Measurement uncertainty; Microwave Theory and Techniques Society; Microwave measurements; Nitrogen; Particle measurements; Phase measurement; Web pages;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2008.924785
Filename
4561583
Link To Document