Title :
Feeling uncertain about uncertainty? [Member Benefits]
Author :
Ridler, Nick ; Yeou-Song Lee ; Blackham, David
Author_Institution :
Nat. Phys. Lab., Teddington
Abstract :
The IEEE microwave theory and techniques society (MTT-S) "Microwave Measurements" committee has recently set up an online forum aimed at uncertainty and quality of measurement. The "Errors and Uncertainties for VNA Measurements" forum focuses on methods that can be used to evaluate errors and uncertainties in vector network analyzer (VNA) and VNA-related measurements, particularly at high frequencies (1 kHz to 1 THz).
Keywords :
measurement errors; measurement uncertainty; microwave measurement; network analysers; IEEE Microwave Theory and Techniques Society microwave measurements; VNA measurements; errors; uncertainty measurement; vector network analyzer; Argon; Density measurement; Frequency measurement; Measurement uncertainty; Microwave Theory and Techniques Society; Microwave measurements; Nitrogen; Particle measurements; Phase measurement; Web pages;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMM.2008.924785
