DocumentCode :
787282
Title :
A computational study of thin-body, double-gate, Schottky barrier MOSFETs
Author :
Guo, Jing ; Lundstrom, Mark S.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
49
Issue :
11
fYear :
2002
fDate :
11/1/2002 12:00:00 AM
Firstpage :
1897
Lastpage :
1902
Abstract :
Nanoscale Schottky barrier MOSFETs (SBFETs) are explored by solving the two-dimensional Poisson equation self-consistently with a quantum transport equation. The results show that for SBFETs; with positive, effective metal-semiconductor barrier heights, the on-current is limited by tunneling through a barrier at the source. If, however, a negative metal-semiconductor barrier height could be achieved, on-current of SBFETs would approach that of a ballistic MOSFET. The reason is that the gate voltage would then modulate a thermionic barrier rather than a tunneling barrier, a process similar to ballistic MOSFETs and one that delivers more current.
Keywords :
MOSFET; Poisson equation; Schottky barriers; nanoelectronics; semiconductor device models; nanoscale Schottky barrier MOSFETs; negative metal-semiconductor barrier height; on-current; positive metal-semiconductor barrier heights; quantum transport equation; self-consistent solution; thermionic barrier; thin-body double-gate Schottky barrier MOSFETs; tunneling; two-dimensional Poisson equation; Degradation; Fabrication; Immune system; MOSFETs; Nanoscale devices; Poisson equations; Schottky barriers; Silicides; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2002.804696
Filename :
1097905
Link To Document :
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