DocumentCode
787501
Title
Using Bulk Built-in Current Sensors to Detect Soft Errors
Author
Neto, Egas Henes ; Ribeiro, Ivandro ; Vieira, Michele ; Wirth, Gilson ; Kastensmidt, Fernanda Lima
Author_Institution
Univ. Estadualdo Rio Grande do Sul
Volume
26
Issue
5
fYear
2006
Firstpage
10
Lastpage
18
Abstract
Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption
Keywords
SPICE; built-in self test; circuit simulation; combinational circuits; integrated circuit design; integrated circuit testing; logic testing; sequential circuits; SPICE simulations; built-in current sensors; combinational logic; digital system design; integrated circuits; power consumption; sequential logic; soft error detection; Circuit faults; Logic devices; Monitoring; Neutrons; Protons; Pulse generation; Registers; SPICE; Signal generators; Silicon; Built-in tests; Error-checking; Reliability; Testing; and Fault-Tolerance;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2006.103
Filename
1709818
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