Title :
Application of ADC Technique to Ratio-Circuits for Yield-Mass Distribution Measurements
Author :
Patwardhan, P.K. ; Indurkar, V.S.
Author_Institution :
Electronics Division Bhabha Atomic Research Centre Trombay - Bombay, India
Keywords :
Analog-digital conversion; Atomic measurements; Current measurement; Detectors; Fluctuations; Linearity; Pulse amplifiers; Pulse circuits; Pulse measurements; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1968.4324870
