DocumentCode
787517
Title
Application of ADC Technique to Ratio-Circuits for Yield-Mass Distribution Measurements
Author
Patwardhan, P.K. ; Indurkar, V.S.
Author_Institution
Electronics Division Bhabha Atomic Research Centre Trombay - Bombay, India
Volume
15
Issue
1
fYear
1968
Firstpage
323
Lastpage
331
Keywords
Analog-digital conversion; Atomic measurements; Current measurement; Detectors; Fluctuations; Linearity; Pulse amplifiers; Pulse circuits; Pulse measurements; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1968.4324870
Filename
4324870
Link To Document