• DocumentCode
    787754
  • Title

    Analysis of helical slow-wave structures for space TWTs using 3-D electromagnetic simulators

  • Author

    Aloisio, Marinella ; Waller, Pierre

  • Author_Institution
    Eur. Space Agency ESA/ESTEC, Noordwijk, Netherlands
  • Volume
    52
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    749
  • Lastpage
    754
  • Abstract
    This paper presents a detailed analysis of traveling wave tube (TWT) helical slow-wave structures (SWSs) using three-dimensional (3-D) electromagnetic simulators. The main advantages of this approach are its capability to take into account the real 3-D geometry of this complex structure, and consequently to eliminate the approximations used in the analytical approach. In addition, it provides higher accuracy than experimental results. Two different methods have been applied (finite elements and finite integration) to predict the cold parameters (phase velocity, coupling impedance, and attenuation) at a level of accuracy higher than the usual practice. An extended analysis has been performed to guarantee the stability and accuracy of the results, as well as to study the sensitivity of the results to the discretization. This paper has shown that both methods, as implemented in two commercially available simulators, are perfectly suitable for the accurate modeling of such complex geometries.
  • Keywords
    circuit simulation; finite element analysis; integration; slow wave structures; solid modelling; 3D electromagnetic simulators; 3D geometry; attenuation; cold parameters; coupling impedance; finite elements; finite integration; helical slow-wave structures; phase velocity; traveling wave tube; Analytical models; Attenuation; Electromagnetic analysis; Electromagnetic scattering; Finite element methods; Geometry; Impedance; Performance analysis; Solid modeling; Space exploration; Cold parameters; finite element (FE); finite integration (FI); helix; slow-wave structure (SWS); traveling wave tube (TWT);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.845866
  • Filename
    1424356