Title :
Useful Techniques for Analyzing Capacitor Transients in a Radiation Environment
Author_Institution :
International Business Machines Corporation Federal Systems Division Electronics Systems Center Owego, New York
fDate :
4/1/1968 12:00:00 AM
Abstract :
Some useful techniques of evaluating the radiation-induced transient response of circuits employing capacitors by using transient circuit analysis programs are discussed. Analysis methods to relate the capacitor´s radiation-induced current generator to the basic parameters, ¿(t), Kp, Kd, and ¿d, using existing circuit analysis programs are given. An expression relating the change in voltage resulting from an absorbed dose for an arbitrary burst shape is also derived.
Keywords :
Capacitors; Circuit analysis; Conductivity; Data processing; Equations; Radiation effects; Shape; Transient analysis; Transient response; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1968.4324903