DocumentCode
787824
Title
Generation of correlated parameters for statistical circuit simulation
Author
Eshbaugh, Kevin S.
Author_Institution
Harris Intelligent Power Products, Research Triangle Park, NC, USA
Volume
11
Issue
10
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
1198
Lastpage
1206
Abstract
Standard transformations for converting non-Gaussian raw data to the Gaussian domain are reviewed. Once the appropriate transformation is determined, conversion formulas are developed so that only the raw data´s mean and variance are required to convert any future data points to the Gaussian domain. With the input parameters represented in terms of the Gaussian distribution, techniques from multivariate statistics are used to generate statistically correlated sets of parameters. The method used to generate input parameters for Monte Carlo simulations is examined. The technique is based on the relatively easy generation of statistically independent observations and their relationship to the more general case of statistically dependent observations by way of the parameters´ correlation matrix. A method called deterministic tracking of model parameters is developed. Using the definition of an isodensity contour for a p-variate normal density function, an expression is derived to calculate the most probable setting of input parameters, given that a subset of these parameters was first fixed to specific values. A simple but realistic three-variable example of the methods developed is shown
Keywords
Monte Carlo methods; circuit analysis computing; correlation methods; matrix algebra; statistical analysis; Gaussian distribution; Gaussian domain; Monte Carlo simulations; correlated parameters; correlation matrix; deterministic tracking; isodensity contour; model parameters; multivariate statistics; p-variate normal density function; statistical circuit simulation; Circuit simulation; Density functional theory; Fabrication; Gaussian distribution; Integrated circuit modeling; Manufacturing processes; Monte Carlo methods; Power system modeling; Predictive models; Response surface methodology;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.170985
Filename
170985
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