• DocumentCode
    787824
  • Title

    Generation of correlated parameters for statistical circuit simulation

  • Author

    Eshbaugh, Kevin S.

  • Author_Institution
    Harris Intelligent Power Products, Research Triangle Park, NC, USA
  • Volume
    11
  • Issue
    10
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1198
  • Lastpage
    1206
  • Abstract
    Standard transformations for converting non-Gaussian raw data to the Gaussian domain are reviewed. Once the appropriate transformation is determined, conversion formulas are developed so that only the raw data´s mean and variance are required to convert any future data points to the Gaussian domain. With the input parameters represented in terms of the Gaussian distribution, techniques from multivariate statistics are used to generate statistically correlated sets of parameters. The method used to generate input parameters for Monte Carlo simulations is examined. The technique is based on the relatively easy generation of statistically independent observations and their relationship to the more general case of statistically dependent observations by way of the parameters´ correlation matrix. A method called deterministic tracking of model parameters is developed. Using the definition of an isodensity contour for a p-variate normal density function, an expression is derived to calculate the most probable setting of input parameters, given that a subset of these parameters was first fixed to specific values. A simple but realistic three-variable example of the methods developed is shown
  • Keywords
    Monte Carlo methods; circuit analysis computing; correlation methods; matrix algebra; statistical analysis; Gaussian distribution; Gaussian domain; Monte Carlo simulations; correlated parameters; correlation matrix; deterministic tracking; isodensity contour; model parameters; multivariate statistics; p-variate normal density function; statistical circuit simulation; Circuit simulation; Density functional theory; Fabrication; Gaussian distribution; Integrated circuit modeling; Manufacturing processes; Monte Carlo methods; Power system modeling; Predictive models; Response surface methodology;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.170985
  • Filename
    170985