Title :
A peeling algorithm for extraction of the HBT small-signal equivalent circuit
Author :
Sheinman, Benny ; Wasige, Edward ; Rudolph, Matthias ; Doerner, Ralf ; Sidorov, Victor ; Cohen, Shimon ; Ritter, Dan
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fDate :
12/1/2002 12:00:00 AM
Abstract :
Direct extraction is the most accurate method for the determination of equivalent-circuits of heterojunction bipolar transistors (HBTs). The method is based on first determining the parasitic elements and then the intrinsic elements analytically. The accuracy and robustness of the whole algorithm therefore is determined by the quality of the extraction of the extrinsic elements. This paper focuses on a new extraction method for the extrinsic capacitances which have proven to be the main source of uncertainty compared to the other extrinsic parameters. Concerning the intrinsic parameters, all the elements are extracted using exact closed-form equations, including exact expressions for the base-collector capacitances, which model the distributed nature of the base. The expressions for the base-collector capacitances are valid for both the hybrid-π and the physics-based T-topology equivalent circuits. Extraction results for InP HBT devices on measured S-parameters up to 100 GHz demonstrate good modeling accuracy.
Keywords :
S-parameters; capacitance; equivalent circuits; heterojunction bipolar transistors; microwave bipolar transistors; millimetre wave bipolar transistors; semiconductor device models; 100 GHz; HBT small-signal equivalent circuit; InP; InP HBT devices; S-parameters; base-collector capacitances; closed-form equations; equivalent circuit extraction; extrinsic capacitances; heterojunction bipolar transistors; hybrid-π equivalent circuits; intrinsic elements; parameter extraction; parasitic elements; peeling algorithm; physics-based T-topology equivalent circuits; Equations; Equivalent circuits; Frequency measurement; Heterojunction bipolar transistors; Indium phosphide; Parameter extraction; Parasitic capacitance; Robustness; Scattering parameters; Uncertainty;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.805195