Title :
The effect of sputtering conditions on the exchange fields of Co xNi1-xO and NiFe
Author :
Devasahayam, Adrian J. ; Kryder, Mark H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
The effect of changing sputtering parameters on the magnetic properties of CoxNi1-xO/Ni81Fe19 exchange couples were studied. The thicknesses of the two layers were kept constant at 500 Å and 200 Å respectively. Substrate bias and sputtering pressure were varied for the CoNiO layer while the conditions for the NiFe layer were kept constant. We observed an increase in the exchange fields with increasing negative substrate bias and with decreasing sputtering pressure. X-ray studies revealed a correlation between the observation of exchange fields and film texture. Blocking temperatures were also measured and were found to increase with substrate bias
Keywords :
X-ray diffraction; cobalt compounds; exchange interactions (electron); iron alloys; magnetic thin films; nickel alloys; nickel compounds; sputter deposition; texture; 200 angstrom; 500 angstrom; CoxNi1-xO/Ni81Fe19 exchange couples; CoNiO-NiFe; X-ray studies; blocking temperatures; exchange fields; film texture; magnetic properties; sputtering conditions; sputtering pressure; substrate bias; Corrosion; Couplings; Magnetic films; Magnetic heads; Magnetic properties; Magnetic sensors; Sputtering; Substrates; Temperature measurement; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
