DocumentCode
788143
Title
Increasing image resolution in electrical impedance tomography
Author
Hou, W.D. ; Mo, Y.L.
Author_Institution
Dept. of Commun. Eng., Shanghai Univ., China
Volume
38
Issue
14
fYear
2002
fDate
7/4/2002 12:00:00 AM
Firstpage
701
Lastpage
702
Abstract
An effective approach to increase the image resolution in static electrical impedance tomography is proposed, in which the image with local high resolution is reconstructed by fine meshing only the impedance abnormal element in the finite element model based on a genetic algorithm. Experimental results from a laboratory phantom are presented
Keywords
electric impedance imaging; finite element analysis; genetic algorithms; image reconstruction; image resolution; medical image processing; EIT image; FEM; fine meshing; finite element model; genetic algorithm; image reconstruction; image resolution improvement; impedance abnormal element; local high resolution; static electrical impedance tomography;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20020477
Filename
1019820
Link To Document