DocumentCode :
788730
Title :
Radon transform orientation estimation for rotation invariant texture analysis
Author :
Jafari-Khouzani, Kourosh ; Soltanian-Zadeh, Hamid
Author_Institution :
Radiol. Image Anal. Lab., Henry Ford Health Syst., Detroit, MI, USA
Volume :
27
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
1004
Lastpage :
1008
Abstract :
This paper presents a new approach to rotation invariant texture classification. The proposed approach benefits from the fact that most of the texture patterns either have directionality (anisotropic textures) or are not with a specific direction (isotropic textures). The wavelet energy features of the directional textures change significantly when the image is rotated. However, for the isotropic images, the wavelet features are not sensitive to rotation. Therefore, for the directional textures, it is essential to calculate the wavelet features along a specific direction. In the proposed approach, the Radon transform is first employed to detect the principal direction of the texture. Then, the texture is rotated to place its principal direction at 0 degrees. A wavelet transform is applied to the rotated image to extract texture features. This approach provides a features space with small intraclass variability and, therefore, good separation between different classes. The performance of the method is evaluated using three texture sets. Experimental results show the superiority of the proposed approach compared with some existing methods.
Keywords :
Radon transforms; feature extraction; image texture; wavelet transforms; Radon transform orientation estimation; anisotropic textures; directional textures; isotropic images; rotation invariant texture analysis; wavelet features; Anisotropic magnetoresistance; Application software; Computer vision; Feature extraction; Frequency; Image analysis; Image processing; Image texture analysis; Strontium; Wavelet transforms; Index Terms- Texture classification; Radon transform; rotation invariance.; wavelet transform; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Graphics; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2005.126
Filename :
1424459
Link To Document :
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