DocumentCode :
788896
Title :
In-plane velocity-field characteristics of InAs self-assembled quantum dot layers
Author :
Kochman, B. ; Ghosh, S. ; Singh, J. ; Bhattacharya, P.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
38
Issue :
14
fYear :
2002
fDate :
7/4/2002 12:00:00 AM
Firstpage :
752
Lastpage :
753
Abstract :
The in-plane velocity-field characteristics of InAs self-assembled quantum dots are measured experimentally and modelled theoretically with Monte Carlo simulation. An unusual result is observed in that the mobility increases at higher electric fields. This is because the more energetic electrons are less likely to be trapped by the quantum dots, resulting in a higher electron mobility
Keywords :
III-V semiconductors; Monte Carlo methods; electron mobility; indium compounds; self-assembly; semiconductor quantum dots; InAs; InAs self-assembled quantum dot; Monte Carlo simulation; electron mobility; in-plane velocity-field characteristics;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20020504
Filename :
1019892
Link To Document :
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