Title :
Distortion in RF CMOS short-channel low-noise amplifiers
Author :
Baki, Rola A. ; Tsang, Tommy K K ; El-Gamal, Mourad N.
Author_Institution :
Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Canada
Abstract :
An approach to estimate the distortion in CMOS short-channel (e.g. 0.18-μm gate length) RF low-noise amplifiers (LNAs), based on Volterra´s series, is presented. Compact and accurate frequency-dependent closed-form expressions describing the effects of the different transistor parameters on harmonic distortion are derived. For the first time, the second-order distortion (HD2), in CMOS short-channel based LNAs, is studied. This is crucial for systems such as homodyne receivers. Equations describing third-order intermodulation distortion in RF LNAs are reported. The analytical analysis is verified through simulations and measured results of an 0.18-μm CMOS 5.8-GHz folded-cascode LNA prototype chip geared toward sub-1-V operation. It is shown that the distortion is independent of the gate-source capacitance Cgs of the MOS transistors, allowing an extra degree of freedom in the design of LNA circuits. Distortion-aware design guidelines for RF CMOS LNAs are provided throughout the paper.
Keywords :
CMOS analogue integrated circuits; MMIC amplifiers; Volterra series; field effect MMIC; harmonic distortion; intermodulation distortion; low noise amplifiers; 0.18 micron; 5.8 GHz; MOS transistors; RF CMOS low-noise amplifiers; Volterra series; distortion estimation; folded-cascode LNA prototype chip; frequency-dependent closed-form expressions; harmonic distortion; homodyne receivers; second-order distortion; short-channel low-noise amplifiers; third-order intermodulation distortion; Analytical models; Circuit simulation; Closed-form solution; Distortion measurement; Equations; Harmonic distortion; Intermodulation distortion; Low-noise amplifiers; Radio frequency; Semiconductor device measurement; Closed-form expressions; RF low-noise amplifier (LNA); Volterra series; intermodulation distortion; second-order distortion (HD2); short-channel CMOS; third-order harmonic distortion (HD3);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2005.860897