DocumentCode :
789108
Title :
Design and modeling of 4-bit slow-wave MEMS phase shifters
Author :
Lakshminarayanan, Balaji ; Weller, Thomas M.
Author_Institution :
Electr. Eng. Dept., Univ. of South Florida, Tampa, FL
Volume :
54
Issue :
1
fYear :
2006
Firstpage :
120
Lastpage :
127
Abstract :
A true-time-delay multibit microelectromechanical systems (MEMS) phase-shifter topology based on impedance-matched slow-wave coplanar-waveguide sections on a 500-mum-thick quartz substrate is presented. A semilumped model for the unit cell is derived and its equivalent-circuit parameters are extracted from measurement and electromagnetic simulation data. This unit cell model can be cascaded to accurately predict N-section phase-shifter performance. Experimental data for a 4.6-mm-long 4-bit device shows a maximum phase error of 5.5deg and S11 less than -21 dB from 1 to 50 GHz with worst case S21 less than -1.2 dB. In a second design, the slow-wave phase shifter was additionally loaded with MEMS capacitors to result in a phase shift of 257deg/dB at 50 GHz, while keeping S11 below -19 dB (with S21<-1.9 dB). The beams are actuated using high-resistance SiCr bias lines with typical actuation voltage around 30-45 V
Keywords :
coplanar waveguides; micromechanical devices; microwave phase shifters; network topology; quartz; slow wave structures; 1 to 50 GHz; 4 bit; 4.6 mm; 500 micron; MEMS capacitors; MEMS phase shifters; SiCr; electromagnetic simulation data; equivalent-circuit parameters; impedance-matched coplanar-waveguide; loaded transmission line; microelectromechanical systems; quartz substrate; semilumped model; slow-wave coplanar-waveguide; slow-wave phase shifters; Capacitors; Data mining; Electromagnetic measurements; Electromagnetic modeling; Impedance; Microelectromechanical systems; Micromechanical devices; Phase shifters; Predictive models; Topology; Loaded transmission line; RF MEMS; micromechanical systems (MEMS); phase shifter;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.860332
Filename :
1573804
Link To Document :
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