• DocumentCode
    789209
  • Title

    Kink-free design of submicrometer MRAM cell

  • Author

    Lee, K.J. ; Park, Wanjun ; Kim, Taewan

  • Author_Institution
    Storage Lab., Samsung Adv. Inst. of Technol., Suwon, South Korea
  • Volume
    39
  • Issue
    5
  • fYear
    2003
  • Firstpage
    2842
  • Lastpage
    2844
  • Abstract
    Full micromagnetic simulations have been performed to investigate the origin of a kink in a magnetoresistive curve and to design a kink-free magnetoresistive random access memory (MRAM) cell. The kink in an at-field curve can originate from the 2π-wall or the vortex formation, which is strongly dependent on the magnetic properties and the geometry of a free layer. The kink originating from the 2π-wall formation was found to disappear in a remanent magnetization curve; therefore, it should not affect the selectivity of a MRAM array. It turned out that the vortex formation was the major origin of the kink when the free layer has the high saturation magnetization and the thick layer thickness. This vortex state is a local minimum state even after removing the external field. Finally, we found kink-free criteria for various saturation magnetizations, thicknesses, and aspect ratios of a free layer.
  • Keywords
    magnetic storage; magnetisation; magnetoresistive devices; micromagnetics; random-access storage; remanence; aspect ratios; high saturation magnetization; kink-free design; kink-free magnetoresistive random access memory cell; magnetic properties; magnetoresistive curve; micromagnetic simulations; remanent magnetization curve; saturation magnetizations; submicrometer MRAM cell; thick layer thickness; vortex formation; vortex state; Anisotropic magnetoresistance; Demagnetization; Magnetic anisotropy; Magnetic properties; Metastasis; Micromagnetics; Perpendicular magnetic anisotropy; Random access memory; Saturation magnetization; Shape;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2003.816240
  • Filename
    1233234