Title :
Quasi-TM MoL/MoM approach for computing the transmission-line parameters of lossy lines
Author :
Plaza, Gonzalo ; Marqués, Ricardo ; Medina, Francisco
Author_Institution :
Dept. of Appl. Phys., Univ. of Seville
Abstract :
This paper presents a quasi-TM approach for the fundamental mode of transmission lines with semiconductor substrates and nonperfect metallic conductors. The approach has allowed us to develop a transmission-line model by properly defining frequency-dependent parameters in terms of the quasi-static electric potential and the electric current density along the propagation direction in the line. The previous quasi-TM analysis avoids the involved numerical root finding process typical in full-wave analysis, and overcomes the limitations of the conventional quasi-TEM approach to account for the effects of the longitudinal currents present both in the lossy substrates and in the nonperfect conductors. The transmission-line parameters have been computed by a hybrid technique that combines the method of lines with the method of the moments (MoM). The total CPU effort has been considerably reduced thanks to the possibility of finding closed-form expressions for the reaction integrals appearing in the MoM. Comparisons with previous computed and measured results show the validity of the present model
Keywords :
absorbing media; current density; electric potential; method of lines; method of moments; transmission lines; electric current density; full-wave analysis; lossy lines; lossy substrates; method of lines; method of the moments; nonperfect metallic conductors; quasi-TEM approach; quasi-TM analysis; quasi-static electric potential; semiconductor substrates; transmission line model; transmission line parameters; Conductors; Coplanar waveguides; Frequency; MMICs; Message-oriented middleware; Microstrip; Power transmission lines; Propagation losses; Substrates; Transmission lines; Conductor losses; coplanar waveguide (CPW); metal–insulator–semiconductor (MIS); method of lines (MoL); microstrip; substrate losses; transmission-line model;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2005.860507