• DocumentCode
    789277
  • Title

    Wide-band electrooptic intensity modulator frequency response measurement using an optical heterodyne down-conversion technique

  • Author

    Lam, Alfred K M ; Fairburn, Mark ; Jaeger, Nicolas A F

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC
  • Volume
    54
  • Issue
    1
  • fYear
    2006
  • Firstpage
    240
  • Lastpage
    246
  • Abstract
    This paper describes a novel system for measuring the frequency response of electrooptic intensity modulators at millimeter-wave frequencies. The system measures |S21| in decibels electrical. In it, the electrical input signal to the modulator is generated by heterodyning two tunable lasers. The output of the modulator is then down-converted to a microwave frequency at which the output is easily measured. Measurements have been made up to 78 GHz using a 55-GHz photodiode as the mixer for the two lasers. In addition, our system tracks any frequency variations in the outputs of the lasers. Our system can also measure the linear response of the modulator if it is operated in nonlinear regions since it can reject higher order harmonics, due to nonlinearities, generated in the modulator
  • Keywords
    electro-optical devices; frequency response; laser tuning; optical modulation; photodiodes; 55 GHz; frequency response measurement; high order harmonics; microwave frequency; millimeter wave frequencies; mixers; optical down-conversion; optical heterodyning; photodiodes; tunable lasers; wideband electrooptic intensity modulator; Electrooptic modulators; Frequency measurement; Frequency modulation; Frequency response; Intensity modulation; Masers; Millimeter wave measurements; Optical mixing; Optical modulation; Wideband; Electrooptic modulators; frequency response; harmonic rejection; optical communications; optical downconversion; optical heterodyning;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.860303
  • Filename
    1573819