DocumentCode :
789308
Title :
Effect of Temperature on Microcircuit Radiation Response
Author :
Johnston, Allan H. ; Bowman, William C.
Author_Institution :
The Boeing Company Seattle, Washington
Volume :
15
Issue :
6
fYear :
1968
Firstpage :
232
Lastpage :
238
Abstract :
The effect of temperature on the primary photocurrent of the base-collector and collector-substrate junctions of isolated transistors from three types of microcircuits was investigated over the temperature range -50° C to 125° C. Only small changes in base-collector primary photocurrent were observed, whereas collector-substrate primary photocurrent increased by a factor of three to five with decreasing temperature. The temperature dependence of the transient response of two microcircuits near the failure threshold is analyzed and shown to depend on the temperature dependence of primary photocurrent and transistor electrical parameters.
Keywords :
Aluminum; Circuits; Photoconductivity; Pulse measurements; Temperature control; Temperature dependence; Temperature distribution; Temperature measurement; Transient response; Wiring;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1968.4325052
Filename :
4325052
Link To Document :
بازگشت