Title :
Analysis and design of distributed ESD protection circuits for high-speed mixed-signal and RF ICs
Author :
Ito, Choshu ; Banerjee, Kaustav ; Dutton, Robert W.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
8/1/2002 12:00:00 AM
Abstract :
Electrostatic discharge (ESD) protection devices can have an adverse effect on the performance of high-speed mixed-signal and RF circuits. This paper presents quantitative methodologies to analyze the performance degradation of these circuits due to ESD protection. A detailed S-parameter-based analysis of these high-frequency systems illustrates the utility of the distributed ESD protection scheme and the impact of the parasitics associated with the protection devices. It is shown that a four-stage distributed ESD protection can be beneficial for frequencies up to 10 GHz. In addition, two generalized design optimization methodologies incorporating coplanar waveguides are developed for the distributed structure to achieve a better impedance match over a broad frequency range (0-10 GHz). By using this optimized design, an ESD device with a parasitic capacitance of 200 fF attenuates the RF signal power by only 0.27 dB at 10 GHz. Furthermore, termination schemes are proposed to allow this analysis to be applicable to high-speed digital and mixed-signal systems.
Keywords :
MMIC; S-parameters; UHF integrated circuits; circuit optimisation; coplanar waveguides; distributed parameter networks; electrostatic discharge; equivalent circuits; high-speed integrated circuits; impedance matching; integrated circuit design; linear network analysis; linear network synthesis; mixed analogue-digital integrated circuits; protection; transmission line theory; 0 to 10 GHz; 200 fF; CPW; RF ICs; S-parameter-based analysis; broadband matching; coplanar waveguides; distributed ESD protection circuits; electrostatic discharge protection; four-stage distributed configuration; generalized design optimization methodologies; high-speed RF circuits; high-speed mixed-signal ICs; optimized design; parasitic capacitance; parasitics; performance degradation; termination schemes; Circuits; Coplanar waveguides; Degradation; Design optimization; Electrostatic discharge; Impedance; Performance analysis; Protection; Radio frequency; Signal design;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2002.801257