Title :
Models for Predicting Transient Radiation Responses in Microcircuits
Author :
Bowman, W.C. ; Beezhold, W. ; Johnston, A.H.
Author_Institution :
The Boeing Company Seattle, Washington
Keywords :
Circuits; Conductivity measurement; Current measurement; Dielectric substrates; Electrical resistance measurement; Photoconductivity; Predictive models; Resistors; Sparks; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1968.4325058
