• DocumentCode
    789410
  • Title

    Domain decomposition FDTD algorithm combined with numerical TL calibration technique and its application in parameter extraction of substrate integrated circuits

  • Author

    Xu, Feng ; Wu, Ke ; Hong, Wei

  • Author_Institution
    Dept. de Genie Electrique, Ecole Polytechnique de Montreal
  • Volume
    54
  • Issue
    1
  • fYear
    2006
  • Firstpage
    329
  • Lastpage
    338
  • Abstract
    An efficient hybrid algorithm, known as the "domain decomposition finite-difference time-domain" (DD-FDTD) method combined with a numerical thru-line (TL) calibration technique, is proposed and developed for the accurate parameter extraction of microwave circuits and structures. By means of a TL technique, the developed FDTD algorithm not only greatly increases the accuracy of numerical simulations but it also saves computation time and memory space. Moreover, the hybrid algorithm can be used for the parameter extraction of arbitrary complex circuits and structures, such as substrate integrated circuits (SICs). The SICs that are studied in this work are based on substrate integrated waveguides, which are useful for the design of millimeter-wave planar circuits such as filters, resonators, and antennas. On the basis of the characteristic features of numerical calibration process, an idea of domain decomposition is introduced to simplify the procedure of programming and simulation and to increase the simulation\´s reliability. Simulation and measurement results have verified this hybrid algorithm
  • Keywords
    finite difference time-domain analysis; integrated circuit design; microwave integrated circuits; FDTD algorithm; domain decomposition; finite-difference time-domain; microwave circuits; millimeter-wave planar circuits; numerical thru-line calibration; parameter extraction; substrate integrated circuits; substrate integrated waveguides; Application specific integrated circuits; Calibration; Circuit simulation; Finite difference methods; Microwave circuits; Microwave theory and techniques; Numerical simulation; Parameter extraction; Silicon carbide; Time domain analysis; Domain decomposition (DD); finite difference time domain (FDTD); numerical calibration; parameter extraction; substrate integrated circuits (SICs); substrate integrated waveguide (SIW);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.860503
  • Filename
    1573830