Title :
Covariance-based uncertainty analysis of the NIST electrooptic sampling system
Author :
Williams, Dylan F. ; Lewandowski, Arkadiusz ; Clement, Tracy S. ; Wang, Jack C M ; Hale, Paul D. ; Morgan, Juanita M. ; Keenan, Darryl A. ; Dienstfrey, Andrew
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO
Abstract :
We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology´s electrooptic sampling system. This formulation offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode
Keywords :
covariance matrices; electro-optical devices; measurement uncertainty; National Institute of Standards and Technology; covariance matrix; electrooptic sampling; impulse response; measurement uncertainty; uncertainty propagation; Covariance matrix; Electric variables measurement; Fourier transforms; Frequency domain analysis; Measurement uncertainty; NIST; Optical beams; Optical pulses; Photodiodes; Sampling methods; Covariance matrix; Jacobian; electrooptic sampling; impulse response; standard uncertainty; uncertainty; uncertainty propagation; variance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2005.860492
