Covariance-based uncertainty analysis of the NIST electrooptic sampling system

Author

Williams, Dylan F. ; Lewandowski, Arkadiusz ; Clement, Tracy S. ; Wang, Jack C M ; Hale, Paul D. ; Morgan, Juanita M. ; Keenan, Darryl A. ; Dienstfrey, Andrew

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO

Volume

54

Issue

1

fYear

2006

Firstpage

481

Lastpage

491

Abstract

We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology´s electrooptic sampling system. This formulation offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode

Keywords

covariance matrices; electro-optical devices; measurement uncertainty; National Institute of Standards and Technology; covariance matrix; electrooptic sampling; impulse response; measurement uncertainty; uncertainty propagation; Covariance matrix; Electric variables measurement; Fourier transforms; Frequency domain analysis; Measurement uncertainty; NIST; Optical beams; Optical pulses; Photodiodes; Sampling methods; Covariance matrix; Jacobian; electrooptic sampling; impulse response; standard uncertainty; uncertainty; uncertainty propagation; variance;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2005.860492

Filename

1573847